Laser Beam Testing

SID4

Key Features

HIGH RESOLUTION WAVEFRONT SENSOR | 400-1100 nm


  • High resolution – 160×120 phase map
  • Easy set-up – direct measurement of diverging and collimated beam
  • Achromaticity – from 400 to 1100nm
  • Self-referenced – insensitive to vibrations & easy to align
  • Compact

 

Specifications

Wavelength range400 - 1100 nm
Aperture dimension3.6 x 4.8 mm2
Spatial resolution29.6 µm
Phase & intensity sampling160 x 120 (> 19 000 points)
Resolution (Phase)< 2 nm RMS
Accuracy10 nm RMS
Acquisition rate60 fps
Real-time processing frequency> 10 fps (full resolution)
Computer connectionGiga Ethernet
Dimensions (w x h x l)54 x 46 x 75.3 mm
Weight~250 g

SID4 Software

Introduction

COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software


The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…
 
wavefront-analysis-software

Specifications

Wavefront analysis
  • Zernike and Legendre projection
  • PSF (Point spread function)
  • Strehl Ratio, Encircled energy...
Beam propagation module
  • Beam profiles
  • Beam waist, M2, Rayleigh length, Divergence, Curvature...
  • Energy distribution, Intensity centroid, Maximum ellipticity, Diameters, Gaussian fit...
Advanced measurement
  • Circular or rectangular pupils
  • Multiple pupils
  • Piston
  • Tilt...
Laser optics measurement
  • Lens, telescope and mirror aberrations
  • Wave front RMS and PtV
  • PSF
  • Automated aberration removal
Acquisition management
  • Live mode, trigger
  • Offline analysis
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