Innovative & patented technology
Expertise in phase measurement analysis
SPIE PW & BIOS 2020
February 1-6, 2020
San Francisco, California, USA
PW Booth #3118
BIOS Booth #8234
Visit us and discover our metrology and imaging solutions to laser engineers, lens manufacturers and cell biologists.
See the event’s website
SWIR-HR High resolution Wavefront sensor
- Extended spectral range: 0.9µm to 1.7µm
- High resolution: 160×120 phase pixels
- High sensitivity : < 2nm phase noise
KaleoMultiWAVE multi-wavelengths interferometer
This optical metrology instrument provides both transmitted and reflected wave front error at multiple wavelengths for filters and coated optics testing at their dedicated wavelengths.