Microscopy Imaging for

Material Inspection


Our quantitative phase imaging (QPI) technique is well suited to be used as an accurate and non-destructive method for refractive index measurements on semi-transparent samples. The QPI technique can provide a precise refractive index profile with sub nanometer precision of waveguides in semi-transparent sample such as glass. For LIDT technique the goal is to detect permanent laser-induced change in the characteristics of the surface of the materials. The advantage of the QWSLI technique is the capability to make in-situ surface analysis.