Lens testing

 

SID4 UV

Key Features

COST-EFFECTIVE UV WAVEFRONT SENSOR | High resolution (62 500 phase pixels)


  • Very high resolution – 250×250 phase map
  • High sensitivity – 2 nm RMS
  • Affordable solution for UV wavefront measurement
  • Perfectly adapted for UV optics testing, UV laser characterization (used in lithography, semiconductor…) and surface inspection (lens and wafers…).

 

Specifications

Wavelength range250 - 400 nm
Aperture dimension7.4 x 7.4 mm2
Spatial resolution29.6 μm
Phase & intensity sampling250 x 250 (62 500 points)
Resolution (Phase)2 nm RMS
Accuracy (absolute)10 nm RMS
Acquisition rate> 30 fps
Real-time processing frequency2 fps (full resolution)
Computer connexionGiga Ethernet
Dimensions (w x h x l)45 x 30 x 100 mm
Weight~250 g

KALEO OEM Software

Introduction

LENS WAVEFRONT ANALYSIS | MTF + Aberrations


Kaleo software is dedicated to lens testing with Phasics wavefront sensors. It takes advantage of Phasics exclusive technique to provide a full set of optical quality parameters: MTF, PSF, aberrations… It assists the whole measurement process from alignment to advanced data analysis to help you getting the most out of wavefront measurement.

lens wavefront measurement software

Key Features

  • The most complete lens test: wavefront error, Zernike coefficient, MTF, PSF….
  • Reliable result calculation using expert algorithms
  • Flexible choices for measurement conditions and analysis: lens orientation, digital focus adjustment, pupil size, settings management…

 

Specifications

Wavefront analysisPhase map
Real time filtering of the wavefront information (Kernel, Zernike-based, Pupil size)
MTF + PSFOne shot full MTF cuve for all frequencies Digital focusing
Lens orientation selection
Acquisition managementSettings management
Camera management
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