Lens testing



Key Features

HIGH RESOLUTION + HIGH SENSITIVITY |for visible and shortwave infrared

The SID4 SWIR wavefront sensor integrates Phasics patented technology with a high quality InGaAs detector. It ensures accurate wavefront analysis in SWIR source and lens testing.

  • Extended spectral range from 0.4 to 1.7µm – possible extension to higher wavelength (2.4µm) – the SID4 SWIR covers visible, NIR and SWIR regions without any calibration
  • Very high resolution – 160×128 phase pixels
  • High sensitivity – < 2nm phase noise through the whole spectral range – the SID4 SWIR is suitable to low energy IR sources
  • Compact and self-referenced for an easy set-up



Wavelength range0.4 – 1.7 µm
(possible extension to 2.4 µm)
Aperture dimension9.60 x 7. 68 mm2
Spatial resolution60 µm
Phase & intensity sampling160 x 128
Resolution (Phase)< 2 nm RMS
Acquisition rateup to 120 Hz
Real-time processing frequency> 10 fps (full resolution)
Computer connectionGiga Ethernet
Dimensions (w x h x l)92 x 50 x 58 mm
Weight355 g

KALEO OEM Software



Kaleo software is dedicated to lens testing with Phasics wavefront sensors. It takes advantage of Phasics exclusive technique to provide a full set of optical quality parameters: MTF, PSF, aberrations… It assists the whole measurement process from alignment to advanced data analysis to help you getting the most out of wavefront measurement.

lens wavefront measurement software

Key Features

  • The most complete lens test: wavefront error, Zernike coefficient, MTF, PSF….
  • Reliable result calculation using expert algorithms
  • Flexible choices for measurement conditions and analysis: lens orientation, digital focus adjustment, pupil size, settings management…



Wavefront analysisPhase map
Real time filtering of the wavefront information (Kernel, Zernike-based, Pupil size)
MTF + PSFOne shot full MTF cuve for all frequencies Digital focusing
Lens orientation selection
Acquisition managementSettings management
Camera management
Contact us to get those products