Surface Analysis

SID4-sC8

Introduction

HIGH RESOLUTION sCMOS QUANTITATIVE PHASE IMAGING CAMERA


Designed for life science and material inspection microscopes, SID4-sC8 brings fast, accurate and truly quantitative phase measurement in a compact, plug-and-play solution.
Biologists will benefit from label-free cell imaging, high sensitivity and automatic segmentation, while material scientists will have access to accurate refractive index measurement, laser damage analysis and surface characterization.

Key Features

  • sCMOS sensor
  • Single shot phase and intensity measurement
  • Magnification from x2.5 to x150
  • Compatible with acquisition software: Metamorph, Micromanager, NIS-Elements…
  • Imaging at any wavelength

Specifications

Sensor technologysCMOS
Wavelength range450-1000 nm
Aperture dimensions16.6 x 14.0 mm²
Phase spatial resolution19.5 μm
Phase & Intensity sampling852 x 720
Resolution (Phase)<1 nm RMS
Acquisition rate40 fps
Real-time processing frequencyUp to 15 Hz (full resolution)
ConnectionUSB 3.0
Dimensions140 x 82 x 80 mm

SID4 range and Software

Introduction

COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software


The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…
 
wavefront-analysis-software

Specifications

Wavefront analysis
  • Zernike and Legendre projection
  • PSF (Point spread function)
  • Strehl Ratio, Encircled energy...
Beam propagation module
  • Beam profiles
  • Beam waist, M2, Rayleigh length, Divergence, Curvature...
  • Energy distribution, Intensity centroid, Maximum ellipticity, Diameters, Gaussian fit...
Advanced measurement
  • Circular or rectangular pupils
  • Multiple pupils
  • Piston
  • Tilt...
Laser optics measurement
  • Lens, telescope and mirror aberrations
  • Wave front RMS and PtV
  • PSF
  • Automated aberration removal
Acquisition management
  • Live mode, trigger
  • Offline analysis
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