Surface Analysis
SID4-sC8
Introduction
HIGH RESOLUTION sCMOS QUANTITATIVE PHASE IMAGING CAMERA
Designed for life science and material inspection microscopes, SID4-sC8 brings fast, accurate and truly quantitative phase measurement in a compact, plug-and-play solution.
Biologists will benefit from label-free cell imaging, high sensitivity and automatic segmentation, while material scientists will have access to accurate refractive index measurement, laser damage analysis and surface characterization.
Biologists will benefit from label-free cell imaging, high sensitivity and automatic segmentation, while material scientists will have access to accurate refractive index measurement, laser damage analysis and surface characterization.
Key Features
- sCMOS sensor
- Single shot phase and intensity measurement
- Magnification from x2.5 to x150
- Compatible with acquisition software: Metamorph, Micromanager, NIS-Elements…
- Imaging at any wavelength
Specifications
| Sensor technology | sCMOS |
| Wavelength range | 450-1000 nm |
| Aperture dimensions | 16.6 x 14.0 mm² |
| Phase spatial resolution | 19.5 μm |
| Phase & Intensity sampling | 852 x 720 |
| Resolution (Phase) | <1 nm RMS |
| Acquisition rate | 40 fps |
| Real-time processing frequency | Up to 15 Hz (full resolution) |
| Connection | USB 3.0 |
| Dimensions | 140 x 82 x 80 mm |
SID4 range and Software
Introduction
COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software
The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…
Specifications
| Wavefront analysis |
|
| Beam propagation module |
|
| Advanced measurement |
|
| Laser optics measurement |
|
| Acquisition management |
|