Surface Analysis


Key Features

UNRIVALLED HIGH RESOLUTION | 400×300 phase pixels

  • Ultra high resolution – 400×300 measurement points – for robust wavefront analysis
  • Achromaticity from 400 to 1100nm – without calibrating
  • Compact
  • Self-referenced: insensitive to vibrations & easy to align
  • Easy set-up: direct measurement of diverging and collimated beam
  • Achieves easy and accurate quantitative phase imaging



Wavelength range400 - 1100 nm
Aperture dimension8.9 x 11.8mm2
Spatial resolution29.6 µm
Phase & intensity sampling300 x 400 (> 120 000 points)
Resolution (Phase)< 2 nm RMS
Accuracy15 nm RMS
Acquisition rate> 10 fps
Real-time processing frequency> 3 fps (full resolution)
Computer connectionGiga Ethernet
Dimensions (w x h x l)54 x 46 x 79 mm
Weight~250 g

SID4 range and Software


COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software

The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…


Wavefront analysis
  • Zernike and Legendre projection
  • PSF (Point spread function)
  • Strehl Ratio, Encircled energy...
Beam propagation module
  • Beam profiles
  • Beam waist, M2, Rayleigh length, Divergence, Curvature...
  • Energy distribution, Intensity centroid, Maximum ellipticity, Diameters, Gaussian fit...
Advanced measurement
  • Circular or rectangular pupils
  • Multiple pupils
  • Piston
  • Tilt...
Laser optics measurement
  • Lens, telescope and mirror aberrations
  • Wave front RMS and PtV
  • PSF
  • Automated aberration removal
Acquisition management
  • Live mode, trigger
  • Offline analysis
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