Laser Beam Testing


Key Features


The SID4 SWIR wavefront sensor integrates Phasics patented technology with a high quality InGaAs detector. It ensures accurate wavefront analysis in SWIR source and lens testing.


  • Extended spectral range from 0.9 to 1.7µm – the SID4 SWIR covers NIR and SWIR regions without any calibration
  • Resolution – 80 x 64 phase pixels
  • High sensitivity – < 2nm phase noise through the whole spectral range – the SID4 SWIR is suitable to low energy IR sources
  • Compact and self-referenced for an easy set-up



Wavelength range0.9 – 1.7 µm
Aperture dimension9.60 x 7. 68 mm2
Spatial resolution120 µm
Phase & intensity sampling80 x 64
Resolution (Phase)< 2 nm RMS
Acquisition rate120 fps
Accuracy15 nm RMS
Real-time processing frequency7 fps (full resolution)
Computer connectionGiga Ethernet
Dimensions (w x h x l)100 x 55 x 63 mm
Weight~ 455 g

SID4 range and Software


COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software

The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…


Wavefront analysis
  • Zernike and Legendre projection
  • PSF (Point spread function)
  • Strehl Ratio, Encircled energy...
Beam propagation module
  • Beam profiles
  • Beam waist, M2, Rayleigh length, Divergence, Curvature...
  • Energy distribution, Intensity centroid, Maximum ellipticity, Diameters, Gaussian fit...
Advanced measurement
  • Circular or rectangular pupils
  • Multiple pupils
  • Piston
  • Tilt...
Laser optics measurement
  • Lens, telescope and mirror aberrations
  • Wave front RMS and PtV
  • PSF
  • Automated aberration removal
Acquisition management
  • Live mode, trigger
  • Offline analysis
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