Lens testing


Key Features

HIGH RESOLUTION + HIGH SENSITIVITY | for shortwave infrared

The SID4 SWIR-HR wavefront sensor integrates Phasics patented technology with a high quality InGaAs detector. It ensures accurate wavefront analysis in SWIR source and lens testing.


  • Extended spectral range from 0.9 to 1.7µm – the SID4 SWIR-HR covers NIR and SWIR regions without any calibration
  • Very high resolution – 160 x 128 phase pixels
  • High sensitivity – < 2nm phase noise through the whole spectral range – the SID4 SWIR-HR is suitable to low energy IR sources
  • Compact and self-referenced for an easy set-up



Wavelength range0.9 – 1.7 µm
Aperture dimension9.60 x 7. 68 mm2
Spatial resolution60 µm
Phase & intensity sampling160 x 128
Resolution (Phase)< 2 nm RMS
Acquisition rate120 fps
Accuracy15 nm RMS
Real-time processing frequency7 fps (full resolution)
Computer connectionGiga Ethernet
Dimensions (w x h x l)100 x 55 x 63 mm
Weight~ 455 g

KALEO OEM Software



Kaleo software is dedicated to lens testing with Phasics wavefront sensors. It takes advantage of Phasics exclusive technique to provide a full set of optical quality parameters: MTF, PSF, aberrations… It assists the whole measurement process from alignment to advanced data analysis to help you getting the most out of wavefront measurement.

lens wavefront measurement software

Key Features

  • The most complete lens test: wavefront error, Zernike coefficient, MTF, PSF….
  • Reliable result calculation using expert algorithms
  • Flexible choices for measurement conditions and analysis: lens orientation, digital focus adjustment, pupil size, settings management…



Wavefront analysisPhase map
Real time filtering of the wavefront information (Kernel, Zernike-based, Pupil size)
MTF + PSFOne shot full MTF cuve for all frequencies Digital focusing
Lens orientation selection
Acquisition managementSettings management
Camera management
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