Laser Optics Test

SID4 UV-HR

Key Features

HIGH RESOLUTION & HIGH SENSITIVITY | from 190 to 400 nm


Based on Phasics patented technology, the SID4 UV-HR wavefront analyzer offers both an unrivalled high resolution and a very great sensitivity. It is perfectly suited for optical components characterization (used in lithography, semiconductor…) and surface inspection (lens and wafers…).
 

  • Very high resolution – 250×250 phase map
  • High sensitivity – 0.5 nm RMS
  • Achromatic – from 190 nm to 400 nm
  • Large analysis pupil – 8.0 x 8.0 mm
  • Compact

 

Specifications

Wavelength range190 - 400 nm
Aperture dimension8.0 x 8.0 mm2
Spatial resolution32 µm
Phase & intensity sampling250 x 250
Resolution (Phase)0.5 nm RMS
Accuracy10 nm RMS
Acquisition rate> 30 fps
Real-time processing frequency1 fps (full resolution)
Computer connectionCamLink
Dimensions (w x h x l)95 x 105 x 84 mm
Weight~900 g

KALEO OEM Software

Introduction

LENS WAVEFRONT ANALYSIS | MTF + Aberrations


Kaleo software is dedicated to lens testing with Phasics wavefront sensors. It takes advantage of Phasics exclusive technique to provide a full set of optical quality parameters: MTF, PSF, aberrations… It assists the whole measurement process from alignment to advanced data analysis to help you getting the most out of wavefront measurement.

lens wavefront measurement software

Key Features

  • The most complete lens test: wavefront error, Zernike coefficient, MTF, PSF….
  • Reliable result calculation using expert algorithms
  • Flexible choices for measurement conditions and analysis: lens orientation, digital focus adjustment, pupil size, settings management…

 

Specifications

Wavefront analysisPhase map
Real time filtering of the wavefront information (Kernel, Zernike-based, Pupil size)
MTF + PSFOne shot full MTF cuve for all frequencies Digital focusing
Lens orientation selection
Acquisition managementSettings management
Camera management
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