Laser Beam Testing

SID4 LWIR

Key Features

HIGH RESOLUTION PHASE & INTENSITY | in the far infrared region


  • Achromatic over the whole LWIR band – from 8-14 µm
  • Uncooled focal plane array technology
  • High resolution : – 160 x 120 phase pixels
  • Compact and easy to use – for easy integration in an optical bench

 

Specifications

Wavelength range8 - 14 µm
Aperture dimension16 x 12 mm2
Spatial resolution100 µm
Phase & intensity sampling160 x 120
Resolution (Phase)75 nm RMS
Accuracy25 nm RMS
Acquisition rate24 fps
Real-time processing frequency> 10 fps (full resolution)
Dimensions (w x h x l)96 x 110 x 90 mm
Weight~850 g

SID4 Software

Introduction

COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software


The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…
 
wavefront-analysis-software

Specifications

Wavefront analysis
  • Zernike and Legendre projection
  • PSF (Point spread function)
  • Strehl Ratio, Encircled energy...
Beam propagation module
  • Beam profiles
  • Beam waist, M2, Rayleigh length, Divergence, Curvature...
  • Energy distribution, Intensity centroid, Maximum ellipticity, Diameters, Gaussian fit...
Advanced measurement
  • Circular or rectangular pupils
  • Multiple pupils
  • Piston
  • Tilt...
Laser optics measurement
  • Lens, telescope and mirror aberrations
  • Wave front RMS and PtV
  • PSF
  • Automated aberration removal
Acquisition management
  • Live mode, trigger
  • Offline analysis
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