Laser Beam Testing

SID4 UV

Key Features

COST-EFFECTIVE UV WAVEFRONT SENSOR | High resolution (62 500 phase pixels)


  • Very high resolution – 250×250 phase map
  • High sensitivity – 2 nm RMS
  • Affordable solution for UV wavefront measurement
  • Perfectly adapted for UV optics testing, UV laser characterization (used in lithography, semiconductor…) and surface inspection (lens and wafers…).

 

Specifications

Wavelength range250 - 400 nm
Aperture dimension7.4 x 7.4 mm2
Spatial resolution29.6 μm
Phase & intensity sampling250 x 250 (62 500 points)
Resolution (Phase)2 nm RMS
Accuracy (absolute)10 nm RMS
Acquisition rate> 30 fps
Real-time processing frequency2 fps (full resolution)
Computer connexionGiga Ethernet
Dimensions (w x h x l)45 x 30 x 100 mm
Weight~250 g

SID4 Software

Introduction

COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software


The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…
 
wavefront-analysis-software

Specifications

Wavefront analysis
  • Zernike and Legendre projection
  • PSF (Point spread function)
  • Strehl Ratio, Encircled energy...
Beam propagation module
  • Beam profiles
  • Beam waist, M2, Rayleigh length, Divergence, Curvature...
  • Energy distribution, Intensity centroid, Maximum ellipticity, Diameters, Gaussian fit...
Advanced measurement
  • Circular or rectangular pupils
  • Multiple pupils
  • Piston
  • Tilt...
Laser optics measurement
  • Lens, telescope and mirror aberrations
  • Wave front RMS and PtV
  • PSF
  • Automated aberration removal
Acquisition management
  • Live mode, trigger
  • Offline analysis
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