Laser Beam Testing

 

SID4 SWIR

Key Features

HIGH RESOLUTION + HIGH SENSITIVITY |for visible and shortwave infrared


The SID4 SWIR wavefront sensor integrates Phasics patented technology with a high quality InGaAs detector. It ensures accurate wavefront analysis in SWIR source and lens testing.
 

  • Extended spectral range from 0.9 to 1.7µm – the SID4 SWIR covers NIR and SWIR regions without any calibration
  • Very high resolution – 160 x 120 phase pixels
  • High sensitivity – < 2nm phase noise through the whole spectral range – the SID4 SWIR is suitable to low energy IR sources
  • Compact and self-referenced for an easy set-up

 

Specifications

Wavelength range0.9 – 1.7 µm
Aperture dimension9.60 x 7. 68 mm2
Spatial resolution60 µm
Phase & intensity sampling160 x 120
Resolution (Phase)< 2 nm RMS
Acquisition rate120 fps
Accuracy15 nm RMS
Real-time processing frequency7 fps (full resolution)
Computer connectionGiga Ethernet
Dimensions (w x h x l)100 x 55 x 63 mm
Weight~ 455 g

SID4 Software

Introduction

COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software


The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…
 
wavefront-analysis-software

Specifications

Wavefront analysis
  • Zernike and Legendre projection
  • PSF (Point spread function)
  • Strehl Ratio, Encircled energy...
Beam propagation module
  • Beam profiles
  • Beam waist, M2, Rayleigh length, Divergence, Curvature...
  • Energy distribution, Intensity centroid, Maximum ellipticity, Diameters, Gaussian fit...
Advanced measurement
  • Circular or rectangular pupils
  • Multiple pupils
  • Piston
  • Tilt...
Laser optics measurement
  • Lens, telescope and mirror aberrations
  • Wave front RMS and PtV
  • PSF
  • Automated aberration removal
Acquisition management
  • Live mode, trigger
  • Offline analysis
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