Laser Beam Testing

 

SID4 NIR

Key Features

HIGH RESOLUTION PHASE & INTENSITY | at 1.55 µm


  • High resolution – 160×120 phase map
  • High NA lens measurement with no relay lens
  • Affordable system in the NIR
  • Compact for an easy integration in an optical bench

 

Specifications

Wavelength range1.5 – 1.6 µm
Aperture dimension3.6 x 4.8 mm2
Spatial resolution29.6 µm
Phase & intensity sampling160 x 120 (> 19 000 points)
Resolution (Phase)< 11 nm RMS
Accuracy15 nm RMS
Acquisition rate> 60 fps
Real-time processing frequency> 10 fps (full resolution)
Dimensions (w x h x l)44 x 33 x 57.5 mm
Weight~250 g

SID4 Software

Introduction

COMPLETE BEAM CHARACTERIZATION | High resolution wavefront analysis software


The SID4 software package manages wavefront acquisition and analysis with one of our wavefront sensors. This software is entirely dedicated to laser beam analysis. It eases the use of the wavefront sensor (camera settings, acquisition modes, alignment helpers, automatic mask adjustment) and provides relevant tools for beam phase analysis: PSF, wavefront aberrations, laser beam parameters, beam profiles…
 
wavefront-analysis-software

Specifications

Wavefront analysis
  • Zernike and Legendre projection
  • PSF (Point spread function)
  • Strehl Ratio, Encircled energy...
Beam propagation module
  • Beam profiles
  • Beam waist, M2, Rayleigh length, Divergence, Curvature...
  • Energy distribution, Intensity centroid, Maximum ellipticity, Diameters, Gaussian fit...
Advanced measurement
  • Circular or rectangular pupils
  • Multiple pupils
  • Piston
  • Tilt...
Laser optics measurement
  • Lens, telescope and mirror aberrations
  • Wave front RMS and PtV
  • PSF
  • Automated aberration removal
Acquisition management
  • Live mode, trigger
  • Offline analysis
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