Kaleo MultiWAVE polychromatic interferometer | UNIQUE INTERFEROMETER | Wave front error at several wavelengths
The Kaleo-MultiWAVE bench is a unique instrument that delivers wave front error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. The KaleoMultiWAVE works at different wavelengths to perform qualification of the optics and coating at the working wavelengths of the coating.
The KaleoMultiWAVE bench is an advantageous alternative to the purchase of several interferometers, the system offers a measurement accuracy comparable to interferometry.
The bench offers a superior accuracy similar to interferometry and a very great dynamics over large diameter.
Measurement are done in double pass, either in transmission or reflection.
Multiple wavelengths on the same bench
- Standard: 625nm – 780nm – 1050nm
- Custom wavelengths on demand: UV – 400-1100nm – SWIR
HIGH DYNAMIC RANGE
More than 20µm PtV
- 10 µm PtV dynamics over large diameter
- Highly aberrated wave front measurement
- Accuracy similar to interferometer
- Very high repeatability
- Very low noise
- Surface measurements
- Coating (AR, Dielectric, Metallic)
- Interference filters…
- Optical manufacturers
- Filter manufacturers
- Space & Defense
- Compliant with ISO 5725 standard
- MetroPro format compatible
- ISO 10110 format available
|Standard Wavelengths||625 / 780 / 1050 nm|
|Custom Wavelengths||400 to 1100 nm|
|Clear Aperture||5.1" (130 mm)|
|Repeatability (ISO 5725)||<5 nm RMS|
|Reproducibility (ISO 5725)||<7 nm RMS|
|Dynamics (Defocus) RWE||10µm PtV|
|Dynamics (Defocus) TWE||200 nm RMS|
|Accuracy (RWE)||<80 nm RMS|
|Accuracy (TWE)||<20 nm RMS|