Lens testing



Kaleo MultiWAVE polychromatic interferometer | UNIQUE INTERFEROMETER | Wave front error at several wavelengths

The Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. The KaleoMultiWAVE works at different wavelengths to perform qualification of the optics and coating at the working wavelengths of the coating.

The KaleoMultiWAVE bench is an advantageous alternative to the purchase of several interferometers, the system offers a measurement accuracy comparable to interferometry.

The bench offers a superior accuracy similar to interferometry and a very great dynamics over large diameter.

Measurement are done in double pass, either in transmission or reflection.

Kaleo MultiWAVE Multiwavelegnth-large dynamic range interferometer

Key Features

Multiple wavelengths on the same bench

  • Standard: 625nm – 780nm – 1050nm
  • Custom wavelengths on demand: UV – 400-1100nm – SWIR


More than 20µm PtV

  • 10 µm PtV dynamics over large diameter
  • Highly aberrated wave front measurement


Interferometric level

  • Accuracy similar to interferometer
  • Very high repeatability
  • Very low noise


  • Surface measurements
  • Coating (AR, Dielectric, Metallic)
  • Interference filters…




  • Optical manufacturers
  • Filter manufacturers
  • Space & Defense
  • Automotive



  • Compliant with ISO 5725 standard
  • MetroPro format compatible
  • ISO 10110 format available


ConfigurationDouble pass
Measurement capabilityRWE of reflective surfaces TWE of transparent optics
Number of wavelengths per instrument1 or 2 (standard), up to 8 (custom)
Custom WavelengthsAny wavelength from 193 nm to 14 μm including:
UV: 266, 355, 405 nm VIS / NIR: 550, 625, 780, 940, 1050 nm
SWIR / MWIR / LWIR: 1.55, 2.0, 3.39, 10.6 μm
Clear Aperture5.1" (130 mm)
Beam height108 mm
Alignment systemLive phase & Zernike coefficients display
PolarizationCompatible with depolarizing optics
Alignment FOV+/- 2°
Pupil focus range+/- 2.5 m
Dimensions / Weight910 x 600 x 260 mm, 25 kg
Vibration isolation<80 nm RMS


RMS repeatability (2) < 0.7 nm (< λ / 900)
Accuracy80 nm PV (3)
Dynamic range (defocus)500 fringes (SFE = 150 μm)
Sample reflectivity range~4% - 100%

(1) On a 4″ pupil size, with a 625 nm source
(2) 36 sequential measurements are performed on a 4” reference mirror, each being averaged 16 times. A reference is defined as the average of all odd numbered measurements. RMS repeatability is then defined as the average RMS difference plus 2 times the standard deviation of the difference between even numbered measurements and the reference.
(3) For a 1 µm PV defocus


Result similar to interferometer

NBP-780 filter – The difference of RWE between the 2 measurements on the same pupil is below 40 nm PtV
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