The KaleoMultiWAVE bench is an advantageous alternative to the purchase of several interferometers, the system offers a measurement accuracy comparable to interferometry. The KaleoMultiWAVE works at different wavelengths to perform qualification of the optics and coating at the working wavelengths of the coating.
Kaleo MultiWAVE polychromatic interferometer | UNIQUE INTERFEROMETER | Wavefront error at several wavelengths
The Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. Moreover optics having a coating can be measured without selective absorption issues.
The bench offers a superior accuracy similar to interferometry and a very great dynamics over large diameter.
Measurement are done in double pass, either in transmission or reflection.
Multiple wavelengths on the same bench
- Standard: 625nm – 780nm – 1050nm
- Custom wavelengths on demand:
UV – 400-1100nm – SWIR
More than 20µm PtV
- 10 µm PtV dynamics over large diameter
- Highly aberrated wavefront measurement
- Accuracy similar to an interferometer
- Very high repeatability
- Very low noise
- Surface measurements
- Coating (AR, Dielectric, Metallic)
- Interference filters…
- Optical manufacturers
- Filter manufacturers
- Space & Defense
- Compliant with ISO 5725 standard
- MetroPro format compatible
- ISO 10110 format available
|Standard Wavelengths||625 / 780 / 1050 nm|
|Custom Wavelengths||400 to 1100 nm|
|Clear Aperture||5.1" (130 mm)|
|Repeatability (ISO 5725)||<5 nm RMS|
|Reproducibility (ISO 5725)||<7 nm RMS|
|Dynamics (Defocus) RWE||10µm PtV|
|Dynamics (Defocus) TWE||200 nm RMS|
|Accuracy (RWE)||<80 nm RMS|
|Accuracy (TWE)||<20 nm RMS|