The Kaleo-MultiWAVE bench is an advantageous alternative to the purchase of several interferometers, this bench offers a measurement accuracy that rivals to interferometry. With the Kaleo-MultiWave bench you can work at different wavelength to fit the coating transmittance (TWE) and reflectance (RWE).
UNIQUE INTERFEROMETER | Wavefront error at several wavelengths
The Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. Moreover optics having a coating can be measured without selective absorption issues.
The bench offers a superior accuracy similar to interferometry and a very great dynamics over large diameter.
Measurement are done in double pass, either in transmission or reflection.
Multiple wavelengths on the same bench
- Standard: 625nm – 780nm – 1050nm
- Custom on demand from 400-1100nm
More than 20µm PtV
- 10 µm PtV dynamics over large diameter
- Highly aberrated wavefront measurement
- Accuracy similar to an interferometer
- Very high repeatability
- Very low noise
- Surface measurements
- Coating (AR, Dielectric, Metallic)
- Interference filters…
- Optical manufacturer
- Compliant with ISO 5725 standard
- MetroPro format compatible
- ISO 10110 format available
|Standard Wavelengths||625 / 780 / 1050 nm|
|Custom Wavelengths||400 to 1100 nm|
|Clear Aperture||5.1" (130 mm)|
|Repeatability (ISO 5725)||4 nm RMS|
|Reproducibility (ISO 5725)||6 nm RMS|
|Accuracy||<20 nm RMS|
|Dimensions||910 x 600 x 260 mm|