Lens testing

KaleoMultiWAVE

The KaleoMultiWAVE bench is an advantageous alternative to the purchase of several interferometers, the system offers a measurement accuracy comparable to interferometry. The KaleoMultiWAVE works at different wavelengths to perform qualification of the optics and coating at the working wavelengths of the coating.

Introduction

Kaleo MultiWAVE polychromatic interferometer | UNIQUE INTERFEROMETER | Wavefront error at several wavelengths


The Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. Moreover optics having a coating can be measured without selective absorption issues.

The bench offers a superior accuracy similar to interferometry and a very great dynamics over large diameter.

Measurement are done in double pass, either in transmission or reflection.

Interferometric solution for optics and coating testing

Key Features

POLYCHROMATIC
Multiple wavelengths on the same bench


  • Standard: 625nm – 780nm – 1050nm
  • Custom wavelengths on demand:
    UV – 400-1100nm – SWIR

HIGH DYNAMICS
More than 20µm PtV


  • 10 µm PtV dynamics over large diameter
  • Highly aberrated wavefront measurement

UPPER PRECISION
Interferometric level


  • Accuracy similar to an interferometer
  • Very high repeatability
  • Very low noise

APPLICATIONS


  • Surface measurements
  • Coating (AR, Dielectric, Metallic)
  • Interference filters…

MARKETS


  • Optical manufacturers
  • Filter manufacturers
  • Space & Defense

COMPLIANCE


  • Compliant with ISO 5725 standard
  • MetroPro format compatible
  • ISO 10110 format available

Specifications

ConfigurationDouble pass
Standard Wavelengths625 / 780 / 1050 nm
Custom Wavelengths400 to 1100 nm
Clear Aperture5.1" (130 mm)
Repeatability (ISO 5725)<5 nm RMS
Reproducibility (ISO 5725)<7 nm RMS
Dynamics (Defocus) RWE10µm PtV
Dynamics (Defocus) TWE200 nm RMS
Accuracy (RWE)<80 nm RMS
Accuracy (TWE)<20 nm RMS
RESULT SIMILAR TO INTERFEROMETER

Result similar to interferometer

NBP-780 filter – The difference of RWE between the 2 measurements on the same pupil is below 40 nm PtV
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