SID4 eSWIR

Spectral Range SWIR (900 - 1700 nm) eSWIR (1.7 - 2.35 µm)

Phasics SID4 eSWIR wavefront sensor

The SID4 eSWIR wavefront sensor integrates Phasics' patented technology with a T2SL detector and is the only high-resolution wavefront sensor covering the extended SWIR range from 0.9 to 2.35 µm. SID4 eSWIR is an innovative solution for testing SWIR sources and lenses used in optical communications, inspection instruments, or night vision in military and surveillance devices.

Key Features

  • Extended spectral range from 0.9 to 2.35 µm
  • High resolution – 80 x 64 phase pixels
  • Compact and self-referenced for easy setup

Applications

Laser testing, adaptive optics, and plasma diagnostics Optics metrology and optical system alignment

Specifications

Wavelength range 0.9 - 2.35 µm
Aperture dimension 9.60 x 7.68 mm²
Spatial resolution 120 μm
Phase and Intensity sampling 80 x 64
Resolution (Phase) < 6 nm RMS*
Accuracy (Absolute) < 40 nm RMS*
Real-time processing frequency 10 Hz (full resolution)
Interface USB 2.0
Dimensions (WxHxL) 90 x 115 x 120 mm³
Weight ~1.8 kg

* for coherent sources

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