SID4

Spectral Range VIS - NIR (400 - 1100 nm)

Phasics SID4 wavefront sensor

Our entry-level yet high-resolution wavefront sensor covering the visible and NIR range, the SID4 is the perfect versatile tool for any laser or optical metrology application

Key Features

  • High sensitivity - 2 nm RMS
  • Achromaticity from 400 - 1100 nm without calibration
  • Self-referenced – insensitive to vibrations & easy to align

Applications

Laser testing, adaptive optics, and plasma diagnostics Optics metrology and optical system alignment

Specifications

Wavelength range 400 - 1100 nm
Aperture dimension 5.02 x 3.75 mm²
Spatial resolution 27.6 µm
Phase and Intensity sampling 182 x 136 (> 24 000 points)
Resolution (Phase) < 2 nm RMS
Accuracy (Absolute) 10 nm RMS
Acquisition rate 60 fps
Real-time processing frequency* 10 Hz (full resolution)
Interface Giga Ethernet
Dimensions (WxHxL) 63 x 65 x 94 mm³
Weight ~ 450 g

*with PhaseStudio Software

Download


Sign up to receive the latest updates and news