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Kaleo MTF station
Spectral Range UV (190 - 400 nm) VIS - NIR (400 - 1100 nm) SWIR (900 - 1700 nm)
The Kaleo MTF instrument is ideal for measuring sets of lenses at the design, prototyping, or production phase. It delivers the most complete lens characterization: on & off-axis MTF, radiometry, and wavefront error at multiple wavelengths. The Kaleo MTF measurement accuracy remains unchanged even at high CRA and FOV.
Key Features
- Compatible with large FOV (up to +/- 90°) and CRA (up to 50°) lenses
- Single shot MTF and WFE measurements
- On & off axis infinite to finite configuration
Applications
Specifications
| MTF on-axis | Accuracy <1%* - Repeatibility <0.5%* |
| MTF off-axis | Accuracy <2%** - Repeatibility <1%** |
| MTF max frequency | 1000 lp/mm |
| Distortion | Accuracy <0.5% - Repeatibility <0.05% |
| OPD (on-axis) | Accuracy <20nm RMS - Repeatibility <5nm RMS |
* This specificaction is obtained for optics measured at 660 nm for 3 frequencies.
** This specification is given over the whole field of view.
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